![]() One of the most common effect we see is scatter from plastic sample holders. These effects can usually be modeled out, but simply knowing which artifacts are being generated from scatter off the sample holder vs amorphous content or phases present in the sample itself can make the difference between an easy analysis and a grinding, iterative march toward a final result. One of the issues we see often is scattering and diffraction effects that are actually being caused by the sample holder itself. Some of which are easy to deal with, others are unavoidable. XRD patterns are complicated by a variety of undesirable effects. Posted by: Ken Stauver In: Uncategorized 0 comments Tags: Bruker, Bruker D5000, crystallography, D2 Phaser, D500, D5000, D5005, D8, Diffraction, Diffractometer, geology, KS Analytical, Materials Data Inc, MDI, Phase analysis, Phase ID, powder XRD, PXRD, Sample holder, sample preparation, Siemens, X-ray, X-ray diffraction, XRD, XRD data collection, zbh, Zero Background Holder ![]()
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